Juin J. Liou
Chair Professor and Director of Microelectronics and Solid State Electronic Devices Research Center of North Minzu University, China, National High-level Talent Expert, Chang Jiang Scholar Endowed Professor of the Ministry of Education, Overseas Renowned Teacher of the Ministry of Education, Academician of the National Academy of Innovation of the United States, Academician of Singapore Institute of Manufacturing Technology, Fellow of IEEE, Fellow of IET, Fellow of AAIA.

Biography: Prof. Juin J. Liou is one of the international authorities on IC reliability and a pioneer in the field of electrostatic protection in China. Over the past 30 years, he has devoted himself to scientific research and teaching to enhance the reliability of integrated circuits, established the first batch of electrostatic protection laboratories in China, and trained many related professionals.

Professor Liou has received several honors from the IEEE, one of the world's most influential electrical and electronic engineering societies, for his significant contributions to research and teaching in the field of integrated circuits, including the IEEE Fellowship, the IEEE Distinguished Lecturer, the IEEE Region III Outstanding Engineering Educator Award, and the IEEE Electron Devices Society's Outstanding Education Award. Professor Liou was the only owner of these two awards in the world in that year.

Prof. Liou has authored 13 monographs, published more than 650 academic papers, holds more than 20 patents, and has served as guest editor of numerous journals and chair of more than 50 international conferences.